List every rail and control pin with nominal value, tolerance, current, quiescent-current target, current limit, ramp, delay, settling time and default state. For depletion-mode devices, apply the manufacturer-defined negative gate condition before drain voltage and reverse the sequence for shutdown. Account for threshold spread and temperature; fixed gate voltage may not hold a safe or repeatable drain current.
Define behavior for hot plug, brownout, overshoot, stored energy in bypass capacitors, RF present during transition, enable chatter, controller reset and partial rail loss. Allocate overvoltage, overcurrent, reverse, ESD, RF overdrive, open or shorted load and thermal protection between device and board. State whether a fault recovers automatically, retries under limits or latches into a safe state.
Measure gate, drain, current and critical control timing at the device-side plane with adequate bandwidth. Verify startup, normal operation, shutdown and credible faults across supply, temperature and sample spread, while monitoring RF output and oscillation. Archive waveforms, limits, board revision and instrument setup; a bench supply sequence written without measured local transients is not closed evidence.